INTEPRO SYSTEMS, market leaders in power component and power system automated test equipment (ATE), announce the introduction of their new ML1800 Series of 1800W modular electronic loads. The ML1800 features an 8-inch TFT LCD colour display with multiple language selection that is visible across the room. The 6-slot chassis is rated at 1800W and can be specified with up to six 300W or three 600W modules. Modules are available with current ratings of 60 or 120 amps with voltages up to 80 or 10 or 20 amps with voltages up to 500V.
The new ML1800 modular load series CC, CV, CR, CP, short circuit, battery and LED operating modes, 20khz transient test speeds with programmable rise, dwell and fall times, inductive load and capacitive load simulation makes it an ideal solution for testing of today’s sophisticated power supplies, batteries, LEDs, adaptors and converters.
The 16-bit programming and measurement resolution lets the ML1800 be operated as standalone instrument as well as having the capability to be integrated into a larger test system. It offers 10 User programmable stored test sequences of up to 10 steps each. Programs can be run once, continuously looped or run once and then chained to other programs to provide very complex loading profiles.
A major advantage to users of the ML1800 load series is the ability to change test modes without turning off the load input. This allows the ML1800 series to more accurately simulate load testing applications. Turn-on capacitance and inductance simulation is easily performed using the CC Rise and CV Rise modes. In addition, the load’s LED mode and Battery simulation functions allow for quick setup and execution for these power products. The CC to CV and CR to CV functions also provide the user with special loading simulation features.
Simon Tanner, European Sales Manager of INTEPRO SYSTEMS comments, “The ML1800 is one of the most cost effective electronic loads on the market. The modular design and clear, colourful display makes it easy to see the status of every load whether as a stand-alone instrument or in a test system.”