Date
09/03/2014
PDF
Keysight Technologies announced it will demonstrate a wide range of novel, high-performance flexible test solutions at the European Microwave Week 2014, October 7th to 9th, Rome, Fiera di Roma, Booth F100. The test solutions are used by engineers for designing and testing components for radar systems, antennas and next-generation wireless devices.
Keysight, an eleven year Platinum sponsor of European Microwave Week, will host workshops and demonstrate test solutions in four key areas: aerospace and defense, device characterization, simulation using Keysight’s Advanced Design System (ADS), and research and education. Demonstrations will focus on the following areas.
Wideband Signal Generation and Analysis
Learn about capturing and understanding elusive signals and analyze transient signals using Keysight oscilloscopes and signal analyzers. In combination with real-time spectrum analysis tools, the test system can reveal what is happening inside product designs to solve technical problems for digital communications and radar applications that require demodulation and analysis of wideband signals.
Multi-Emitter Electronic Warfare Test
Learn about signal generation for multi-emitter simulation, from 0 to 40 GHz, and how better simulation fidelity in-the-loop reduces program costs throughout the entire electronic warfare system. Electronic warfare receiver research, development and reprogramming cycles rely on innovative test solutions to drive efficient design and development.
Multi-Channel Antenna Calibration, Reference Solution
Learn how the Multi-Channel Antenna Calibration, Reference Solution, with its breakthrough concepts, dramatically decreases antenna calibration times from weeks to days. By using a high-performance AXIe digitizer platform with multiple, phase-coherent channels and real-time digital down-conversion, measurements can be performed on multiple antenna elements in parallel resulting in faster, highly accurate antenna phase and amplitude measurement results. This Reference Solution provides an entry point and key elements for quick and easy integration into an existing multi-channel antenna calibration test environment.
Material Characterization from mm-Wave to THz
Learn about measuring the relative permittivity and loss tangent of dielectric materials at mm-wave and THz frequency for critical information needed for material and circuit design, modelling, research, manufacturing and quality control. This information is particularly critical for stealth materials, dielectric substrates, microwave food products and biofuels, where accurate characterization of their electromagnetic properties is required.
Complete Characterization of Active Components
Learn how to confirm that today’s electronic components, which are highly integrated and embedded with functionality, will work properly in all possible conditions. Test instruments, such as the PNA-X Series of microwave network analyzers, deliver integrated, multifunction measurement capability that can completely characterize active devices like amplifiers, mixers and frequency converters.
Measuring Phase Noise and Noise Figure
Learn about recent improvements in Y-factor noise figure measurement with new USB preamplifiers, noise sources with better calibrations, and better estimation of mismatch uncertainty. Using the cold-noise technique of the PNA-X, with its very accurate source correction methodology, ensures the ultimate noise figure measurement accuracy—especially in a challenging environment like on-wafer measurements.
True EM/Circuit Co-Simulation Capability
Learn how to perform a true EM/circuit co-simulation using Keysight’s Advanced Design System, including sweep/optimization with common database architecture in the OpenAccess format. The demonstrations will show frequency and time domain 3D EM simulation examples including EMI/EMC analysis.
RF Power Amplifier Module Design with ADS
Learn how to design a multi-technology RF power amplifier module using ADS layout. The demonstrations will consist of a module design approach, environment setup, incorporating multiple technologies such as setting up substrate definitions, floor planning, routing, inductor design, full module simulation, verification and export for manufacturing.
Innovative Solutions for Research
Learn how to develop multifunction and multiport scalable test beds for research projects with PXI-based measurement setups. Understand the benefits of multiple measurement functionalities, switching, attenuation and other components integrated into a single, “ready-to-go” chassis. Experience the same measurement science, using known and proven Keysight software, to make measurements that can be quickly correlated and transferred between traditional benchtop instruments and PXI-based setups throughout the product development lifecycle.
Research on 5G and mmW Communication
Learn how to generate and analyze a variety of millimeter-wave communications signals, including 802.11ad, 5G, and backhaul with a flexible suite of solutions including generators, upconverters, downconverters, analyzers and power sensors.
Keysight Technical Workshops
Keysight’s ‘Connect with the Experts’ workshops will allow attendees to meet Keysight industry experts focused on the following topics:
· New Aerospace & Defense applications demanding advanced test solutions.
· Latest development in material measurement and device characterization.
· Solving design challenges with EDA software.
· Wireless research future: the quest for higher and broader frequency bands.
· RF & microwave measurement fundamentals.
About Keysight Technologies
On Sept. 19, 2013, Agilent Technologies announced plans to separate into two publicly traded companies through a tax-free spinoff of its electronic measurement business. The new company, Keysight Technologies, began operating as a wholly owned subsidiary of Agilent on Aug. 1, 2014 with a full separation anticipated in early November 2014.
