Chromasens Launches New Flagship of allPIXA evo Line-Scan Camera Series

­Chromasens unveiled its new allPIXA evo 32k line-scan camera, which achieves an amazing 73 kHz line rate at full resolution by combining a CoaXPress CXP-12 four-lane interface with a CMOS multi-line 32768-pixel monochrome sensor. The new flagship to the company's allPIXA evo Series, the allPIXA evo 32k camera significantly improves detectability in demanding inspection applications, such as semiconductors, wafers, and PCBs. 

Microcracks, uneven deposition, or particle contamination can impair chip performance and cause major production delays. With feature sizes shrinking to the 2–3 nm scale, imaging systems must resolve intricate details and flaws that were once invisible. The Chromasens allPIXA evo 32k allows for the detection of sub-pixel defects that helps to maintain yield rates and process consistency in semiconductor fabrication. It uses state-of-the-art algorithms, two 16k sensor arrays featuring 5 μm pixels, and 1/2 pixel offset to generate an outstanding 32k image. Large 5 μm x 5 μm pixels improve light sensitivity compared to smaller size pixels, allowing for faster inspections with the same light intensity. 

To leverage the full performance of the 32k sensor, Chromasens integrated the latest CXP-12 interface supporting data output up to 12.5 Gbps per cable. By aggregating multiple lanes, the total bandwidth can exceed 50 Gbps, providing the necessary throughput for high-resolution and high-speed imaging applications. Its low latency and jitter ensure stable, reliable performance for high-speed industrial inspections. CoaXPress also offers robust features such as triggering, Power over CXP, and long cable lengths at full speed.

Packed into a small form factor, the allPIXA evo 32k is simple to install into space-constrained areas on manufacturing lines. Full GenICam and GigE Vision compliance means it can be deployed with various image processing software and other compatible devices. 

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