Keithley's free web-based seminar explores how to choose and use a source measure unit instrument

Date
07/11/2013

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Keithley Instruments, a leader in advanced electrical test instruments and systems, is offering a free, web-based seminar titled "What is a Source Measure Unit (SMU) Instrument and Which One is Right for Your Application." This event, which is available for on-demand viewing, will offer useful insights into making accurate electrical measurements with SMUs, including the basics of how SMU instruments work, key features and capabilities to consider in selecting one, and an actual performance comparison of different SMU instruments in "real-world" applications. To register for this event, visit www.keithley.com/ws/1395. "What is a Source Measure Unit (SMU) Instrument and Which One is Right for Your Application" is recommended for those with a need to measure current vs. voltage (I/V) and engineers, researchers, educators, and students who need to characterize and test semiconductor-based devices, components, materials, and technologies in particular. Participants will learn how to use a SMU instrument to: Deliver more complete characterization of devices or materials Boost test system productivity Increase overall test system performance About the Presenter Lishan Weng is an applications engineer at Keithley Instruments, which is part of the Tektronix test and measurement portfolio. She has dual Masters degrees in Electrical Engineering and Physics from Purdue University, where her research interests focused on graphene device and p-type GaAs/AlGaAs heterostructures. Her previous research includes carbon nanotube based nanolithography and tunable graphene oxidation, as well as quantum transport measurement and a specialization in AFM lithography. Keithley

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