PSDcast – Qualifying SiC Devices to Stringent Standards



Avi Kashyap with Microchip.

In this episode of the PSDcast, we’re talking to Microchip about one of the biggest challenges for silicon carbide vendors – qualifying their SiC devices to stringent industrial, automotive, and harsh environment standards, one example being AEC- Q101, a stress test qualification for automotive-grade discrete semiconductors. And those challenges will escalate with GaN and SiC ballooning in popularity.

Read Avi’s article here:

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