Renesas Electronics, a premier supplier of advanced semiconductor solutions, is easing safety design complexities for automotive chassis systems with a new leading-edge series of microcontrollers (MCUs) certified to ASIL-D standards. The RH850/P1x Series of 32-bit MCUs features the world’s first automotive chassis MCUs that utilize a 40nm process. Combining the 40nm process with its unique MONOS flash memory structure, Renesas offers an innovative solution for electrical power steering (EPS), brake systems, and other chassis systems, delivering reduced power consumption, and more efficient functional safety system development in chassis systems.
The automotive market is looking for innovative ways to deliver a safer driving experience and peace of mind to drivers and passengers. As a market leader, Renesas is developing solutions that make it easier to bring next-generation automotive systems to market quickly, efficiently, and cost effectively.
Key Features of the RH850/P1 M MCUs:
40 nm process and MONOS flash memory for lower power consumption and higher performance
In addition to the cutting-edge 40 nm process, the use of Renesas-exclusive metal oxide nitride oxide silicon (MONOS) structure, which has an established track record in flash memory, makes possible fast data read performance alongside low power consumption (approximately half that of earlier Renesas products). This means that the use of a standard QFP package and a single power supply with integrated core voltage generation regulator is possible.
Fault-detection functions ideal for chassis systems
Renesas is leveraging more than 10 years of experience delivering high-quality MCU solutions as well as accumulated knowhow from participation in global functional safety standardization activities to reduce the development and design burden on customers. Designed with chassis systems requiring a high fault-detection rate and short control cycles in mind, the RH850/P1x Series integrates an excellent set of fault-detection functions. The CPU employs a lockstep2 system. An error checking and correcting (ECC) function detects and corrects data errors affecting memory, such as flash memory.
There are also fault-detection functions that allow system-level diagnostics of the timers, ADC, serial communication, and other modules. The built-in self-test (BIST) function detects faults affecting the fault-detection functions themselves. The error control module (ECM) allows users to manage error signal input from the various modules. Upon receiving an error signal the ECU, has a variety of options including, setting an error pin output, generating interrupts or the generation of resets, thereby helping to assure both safety and reliability concerns can be addressed.
Full complement of peripheral functions for chassis systems
The RH850/P1x Series incorporates two units of the TSG3 (Timer S Generation 3), an enhanced motor control timer designed to improve the motor control performance of chassis systems. For serial communication, it retains the CAN protocol engine of previous Renesas products and includes RS-CAN, which increases the number of transmit and receive message buffers while incorporating improvements that make the buffers easier to use. Finally, the widely adopted SENT and PSI5 are provided as digital interfaces for sensors.
Samples of the RH850/P1M MCUs are available now. Mass production is scheduled to begin in June 2016 and is expected to reach a scale of 3,000,000 units per month. (Availability is subject to change without notice.)