Increasingly complex embedded systems, using higher-speed serial data busses, make signal integrity issues and higher-bandwidth oscilloscopes newly relevant to the embedded market. The Teledyne LeCroy oscilloscopes, protocol analyzers, logic analyzers, waveform generators, and test solutions showcased at the EE Live 2014 exhibition in San Jose provide the performance and feature sets necessary for complex embedded system development. EE Live attendees can visit booth 722 through April 3 for demonstrations of 20+ serial decoders and triggers; advanced debug tools; protocol analysis and test for USB, DDR, and PCI Express.
Attendees will experience the revolutionary 12-bit HDO-MS high-definition mixed-signal oscilloscopes, which sport powerful mixed-signal debug capabilities for embedded systems development. HDO-MS oscilloscopes combine 16 channels of flexible mixed-signal capabilities with HD4096 high definition technology, long memory, and a compact form factor, in bandwidths from 200 MHz to 1 GHz. Spectrum-analysis and power-measurement software packages extend the oscilloscopes' capabilities while leveraging the 12-bit architecture with its wider dynamic range and improved measurement precision.
Featured demonstrations include higher bandwidth oscilloscopes with a targeted set of digital debug tools. Analog and digital cross pattern triggering, digital timing measurements, parallel pattern search, logic gate emulation and activity indicators are the ideal tools for precise circuit validation and fast debugging of complex embedded designs. These features complement a comprehensive toolset, which includes WaveScan search and find, history-mode waveform playback, sequence acquisition mode, and LabNotebook report generation.
The recently-introduced portable Eclipse X34 MIPI M-PHY Protocol Analyzer for testing mobile computing products is part of the exhibition. Attendees can also learn more about Teledyne LeCroy InSight technology, an innovative approach to the validation and debug of SoC designs in a post-silicon environment where visibility has diminished and complexity has increased.