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February 2023
Developing a New Approach to Predicting the Behavior of GaN Devices

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Figure 1: Infineon’s four-step qualification plan for CoolGaN™ devices

­Introduction Silicon semiconductor technology has evolved considerably over the past 50 years, during which time, multiple failure modes affecting device reliability have been discovered, researched, and addressed. This has led to the development of models and equations for failure modes like time-de
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Date:
02/24/2023

 


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