Keithley Instruments, a leader in advanced electrical test instruments and systems, is offering a free, web-based seminar titled “Optimizing Semiconductor Measurements and Test Times.” This event, which is available for on-demand viewing, discusses how test engineers can meet the challenge of maximizing throughput without sacrificing accuracy in the testing of semiconductor devices. It also provides insight into the high current and high voltage requirements of today's power semiconductor devices.
“Optimizing Semiconductor Measurements and Test Times” offers valuable information to engineers involved in the characterization and testing of semiconductor devices and materials.
Topics discussed include:
-Making fast and accurate measurements of semiconductor devices and materials.
-Achieving optimal low current performance by selecting the right test cables.
-Optimizing production test measurement and analysis using built-in test scripts and a parallel test system configuration.
-Understanding the impact of the four-quadrant source measure unit (SMU) instrument architecture on the charge and discharge time periods of a high voltage test system.
About the Presenter
Jennifer Cheney is a staff applications engineer at Keithley Instruments. She earned a B.S. in electrical engineering from Case Western Reserve University in Cleveland, OH. She has been assisting customers with instrument applications since 2001.