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Test & Measurement

 




 

 

Test & Measurement

July 2014
Intepro introduces SemTest power semiconductor ATE system

The Intepro SemTest automated test system

The Intepro SemTest automated test system is an ideal solution for reliability and extended lifetime testing of Power Semiconductors including IGBT, MOSFET, SCR, Diode and Bipolar parts and modules. This fully integrated solution meets the requirements of JEDEC standards and may be used for product development
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Date:
07/28/2014
Paul Kingsepp of SL Power on power in test & measurement

Paul Kingsepp of SL Power

In this PSDcast Paul Kingsepp, product manager for SL Power Electronics, talks to Alix Paultre of Power Systems Design about the role of power in test & measurement. As systems get more sophisticated, complex, and efficient, the role of power in test gets more an more challenging as well. SL Power Electronics
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Date:
07/25/2014
Configuring high volume test systems for power semiconductors requires balancing the need for high throughput with the need to ensure high measurement integrity. This article addresses some specific challenges of these types of testing applications and how the features and characteristics of modern source measure
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Date:
07/25/2014

On missing planes and black boxes

Alix Paultre, Editorial Director, PSD

In a previous column we explored the issue of black boxes and commercial aircraft accountability (“Should we put bigger batteries in airplane black boxes?”*) through the lens of the Malaysia Airline Flight 370 tragedy. The terrible initial impact of the irreplaceable loss of life was exacerbated by the physical
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Date:
07/23/2014
Eyal Maor of Incredibuild on test virtualization

Eyal Maor of Incredibuild

In this PSDcast Eyal Maor, CEO of Incredibuild, talks to Alix Paultre of Power Systems Design on the complexities of testing today, and how Incredibuild is addressing the issues with their advanced virtualization solution. IncrediBuild accelerates build time through efficient parallel computing, harnessing idle
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Date:
07/16/2014
Agilent Technologies presented the industry’s most accurate test solution for characterizing USB 3.1 receivers. Using the Agilent USB 3.1 receiver test set, design and test engineers in the semiconductor and computer industry can now accurately characterize and verify USB 3.1 receiver ports in ASICs and chipsets. USB
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Date:
07/16/2014
AMETEK Programmable Power, a leader in programmable AC and DC power test solutions, has released a free online Product Selector Guide designed to help engineers locate the optimal AC source or DC power supply quickly and efficiently. By inputting a few simple parameters, engineers can find the power supply that
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Date:
07/16/2014
Driving consumer devices cleanly and efficiently is more important now than ever before, because of the growing amount of functionality being put into products today. From our telecommunications infrastructure to power recliners, people are getting used to an increased level of functionality and interoperability
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Date:
07/08/2014
Teledyne LeCroy's latest 8-Channel 12-bit 1GHz-bandwidth oscilloscope offers HD4096 technology

The HDO8000 is ideal for high-power three-phase power electronics system analysis

Teledyne LeCroy announced the HDO8000 oscilloscope product line with 8 analog input channels, 12-bits of vertical resolution utilizing Teledyne LeCroy’s HD4096 technology, and up to 1 GHz of bandwidth. The HDO8000 oscilloscopes have maximum performance, going further (8 channels), with finer resolution (12-bits)
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Date:
07/04/2014
Teledyne LeCroy's WaveSurfer 3000 oscilloscopes feature the MAUI advanced user interface

The Teledyne LeCroy WaveSurfer 3000 series of oscilloscopes features the MAUI advanced user interface

Teledyne LeCroy introduced the WaveSurfer 3000 series of oscilloscopes featuring the MAUI advanced user interface. This advanced user interface, previously available only on higher-end oscilloscopes, seamlessly integrates a deep measurement toolset and multi-instrument capabilities into a cutting edge user experience
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Date:
07/01/2014

 



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