Test & Measurement

September 2014

IAR Embedded Workbench now serves ARM Cortex-M7 core

IAR Systems launched version 7.30 of IAR Embedded Workbench for ARM® with full support for the new ARM Cortex®-M7 processor core. The processor brings high performance and efficient processing to support devices featuring embedded intelligence across the industrial, infrastructure and domestic sectors. Using IA

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Date:

09/24/2014

ESD Protection: How to Design Safer Consumer Electronics

Phillip Havens and Chad Marak, Littelfuse

Consumers are the single biggest risk to electronic devices such as Smartphones and Tablets that play a vital role in their lives. Not only because they might drop them on the floor, but also because human touch to any device containing sensitive electronic semiconductors can be the source of an ESD (Electro St

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Date:

09/19/2014

Keysight Technologies to demonstrate innovative Test solutions at electronica 2014

Keysight Technologies announced it will demonstrate an innovative and diverse range of electronic test solutions at electronica 2014, Nov. 11 – 14, Munich, Hall A1, Booth 506. These solutions, which help engineers bring their product to market faster, include a broad range of the most recent basic and general pu

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Date:

09/18/2014

Nujira and Rohde & Schwarz host seminars on testing envelope tracking performance

Nujira, a global Envelope Tracking (ET) chip company, and Rohde & Schwarz, leaders in test and measurement, will be hosting a series of joint seminars in China on how ET improves LTE battery life. The two companies will demonstrate test solutions available for evaluating the PA performance with ET technology an

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Date:

09/18/2014

Optimizing high-volume power semiconductor test (Part 2)

Jennifer Cheney, Keithley Instruments

In Part 1 of this article we had a short overview of some of the challenges associated with high-volume testing of power semiconductors, and the test throughput advantages that source measure unit (SMU) instruments offer for these applications. Test systems of this type must be optimized for high throughput wi

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Date:

09/17/2014

Keysight Technologies to hold webcast on advanced arbitrary waveform generator capabilities

This webcast will show how to test modulation formats, pulse shaping and distortions for complex modulated signals or multi-level digital interfaces. Explore the possibilities with Keysight's new arbitrary waveform generator (AWG) that enables leading edge signal generation for 100G, 400G and 1 Terabit research w

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Date:

09/05/2014

Keysight Technologies to highlight design and test solutions at European Microwave Week

Keysight Technologies announced it will demonstrate a wide range of novel, high-performance flexible test solutions at the European Microwave Week 2014, October 7th to 9th, Rome, Fiera di Roma, Booth F100. The test solutions are used by engineers for designing and testing components for radar systems, antennas an

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Date:

09/03/2014