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Test & Measurement

 




 

 

Test & Measurement

October 2014
Steve Sandler of Picotest on power test and noise

Steve Sandler of Picotest

In this PSDcast Steve Sandler of Picotest talks to Alix Paultre of Power Systems Design on the issues of power test, especially in the area of reducing noise. Not only is noise in a system a potential interference hazard, it is also a sign that the system is not operating optimally. Speed, bandwith, and probe
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Date:
10/31/2014
Consider this near-perfect storm: Many utilities in the United States have some part of their infrastructure that is more than 50 years old and long past its predicted useful life.  In addition, many utility workers are aging and approaching retirement, which means they will soon end their careers and take
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Date:
10/26/2014
Simple handheld multimeters often have two inputs for DC current measurements. One input is usually for ranges up to 200mA and the other is for high currents up to 10A or 20A. There is no 2000mA range. So if you need to measure currents in the order of 250mA, you need to use the 20A range, which offers limited
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Date:
10/26/2014

Power quality events are a common occurrence in industrial facilities and standard “industrial” power supplies typically provide a level of immunity to these events.  The most common events are voltage sags (nearly 50%) followed by voltage transients and short duration overvoltage events or “swells”
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Date:
10/26/2014
IAR Systems, a leading provider of development tools for embedded systems, will host a pre-conference seminar in Kista, Stockholm on November 3, 2014. The seminar will cover topics such as efficient programming, safety traps in embedded programming, debugging and runtime analysis. Seminar attendees are also
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Date:
10/23/2014
Keithley's wafer-level support includes high-voltage capacitance-voltage test for parametric curve tracer configurations

Model 8020 High-Power Interface Panel

Keithley Instruments, a leader in advanced electrical test instruments and systems, introduced their latest enhancements to its Parametric Curve Tracer (PTC) configurations that incorporate high-power SourceMeter Source Measure Unit (SMU) instruments. For test engineers responsible for configuring high power
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Date:
10/23/2014
Lee Stauffer of Keithley on wafer-level test

Lee Stauffer of Keithley

In this PSDcast Lee Stauffer, Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group, talks to Alix Paultre of Power Systems Design about wafer-level test. Keithley Instruments recently enhanced its Parametric Curve Tracer configurations that incorporate high power SourceMeter
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Date:
10/22/2014
Ming Wang of Keithley on advanced test interfaces

Ming Wang of Keithley Instruments

In this PSDcast Ming Wang of Keithley Instruments talks to Alix Paultre of Power Systems Design about
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Date:
10/20/2014
Keysight Technologies announced it will demonstrate solutions that provide simulation, debug, validation and test for the fastest speed memory designs at MemCon, Santa Clara Convention Center, Booth102, Santa Clara, Calif., Oct. 15. DDR4/LPDDR4 Bus-Level Signal Insight Using Logic Analysis
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Date:
10/14/2014
Piocotest's latest programmable supplies offer continuous autoranging and power-sequencing capability

P961xA Series programmable, single-output DC power supply

Picotest, a leader in high-resolution test and measurement equipment, has announced the availability of the P961xA Series of programmable, single-output DC power supplies with continuous autoranging and power sequencing capability. The P9610A (105W 36V/7A) and P9611A (150W 60V/6A) offer features and performance
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Date:
10/06/2014
Teledyne LeCroy announced three-phase Motor Drive Power Analyzer software for its HDO8000 oscilloscopes. The HDO8000 mixed-signal oscilloscopes, with 8 input channels, 12-bit resolution, and up to 1 GHz bandwidth, are the perfect solution for motor drive embedded control and power section debug. With the addition
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Date:
10/02/2014

 



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