Test & Measurement
February 2023
Click image to enlarge
Figure 1: Infineon’s four-step qualification plan for CoolGaN™ devices
Introduction
Silicon semiconductor technology has evolved considerably over the past 50 years, during which time, multiple failure modes affecting device reliability have been discovered, researched, and addressed.
This has led to the development of models and equations for failure modes like time-de
. . . Learn More
Date:
02/24/2023
Current Transducer with Large Aperture for Automotive (EV) Test Benches & Battery Testing
Danisense announced the release of its latest current transducer mainly aimed for automotive (EV) test benches and battery testing & evaluation systems. Featuring a very large aperture of 41.2mm, the DN1000ID current transducer enables power cables with large power connectors to be easily fi
. . . Learn More
Date:
02/01/2023
Archives
