Technical Features

February 2016
Developing a New Approach to Predicting the Behavior of GaN Devices

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Figure 1: Infineon’s four-step qualification plan for CoolGaN™ devices

­Introduction Silicon semiconductor technology has evolved considerably over the past 50 years, during which time, multiple failure modes affecting device reliability have been discovered, researched, and addressed. This has led to the development of models and equations for failure modes like time-de
Date:
02/24/2023
Gadgets and vital connected devices in the Internet of Things (IoT) are everywhere, and we see them gradually changing our lives. The exponential development of products with embedding radio transmitters is creating some concerns in terms of interference and equipment disturbance, especially in the case of medical ap
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Date:
02/25/2016
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