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Technical Features

 



 

 

Technical Features

March 2013
Addressing Differential and Common Mode Noise With Innovative Dual-Mode Choke Technology

CMF Series Dual Mode Chokes

Circuit designers must deal with many types of noise: internal, external, RF, line frequency and more. Noise can be a limiting factor in system performance and so must be addressed and minimized. The question is “at what cost and effort?”  Is it better to sacrifice performance or cost?  In either
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Date:
01/12/2018
Using Uninterruptible Power Supplies in harsh environments

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When used in a controlled temperature environment ranging from 0?C to 40?C (32?F to 104?F) any domestically available on-line UPS should meet the requirement, as most have been tested and approved
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Date:
03/12/2013
Manufacturers are increasingly focusing their efforts on energy conservation. This trend is reflected in the growing emphasis on both renewable energy and energy efficiency measures to reduce the
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Date:
03/12/2013
eGaN FETs improve performance in industrial POL converters

Figure 1: Conventional vertical power loop PCB layout (a) Side view (b) MOSFET top view (c) eGaN FET top view

Designers of point of load (POL) converters used in 24 VDC systems traditionally have had to decide between the high cost of an isolated converter and the low frequency and efficiency of a buck
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Date:
03/12/2013

Measuring and sourcing DC transients and other DC test conditions

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1. Biasing with a static DC voltage and measuring current: This is the most basic application of DC power related bench instruments. Any power supply, so long as it has the right voltage and current
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Date:
03/09/2013

 



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