Technical Features

March 2013
Combining Lowest RDS(on) + SMT for Space-Limited, High-Performance Apps

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Figure 1: The Qorvo SiC FET – a ‘cascode’ of a Si-MOSFET and SiC JFET

The performance of wide band-gap (WBG) semiconductor switches such as silicon carbide cascode FETs (‘SiC FET’ henceforth) [1] (Figure 1) and SiC MOSFETs is closely tied to its package. At the pure technology level, nanosecond switching speed and low specific on-resistance result in very low losses, allowing much
Date:
05/30/2023
Using Uninterruptible Power Supplies in harsh environments

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When used in a controlled temperature environment ranging from 0?C to 40?C (32?F to 104?F) any domestically available on-line UPS should meet the requirement, as most have been tested and approved
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Date:
03/12/2013

eGaN FETs improve performance in industrial POL converters

Figure 1: Conventional vertical power loop PCB layout (a) Side view (b) MOSFET top view (c) eGaN FET top view

Designers of point of load (POL) converters used in 24 VDC systems traditionally have had to decide between the high cost of an isolated converter and the low frequency and efficiency of a buck
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Date:
03/12/2013
Manufacturers are increasingly focusing their efforts on energy conservation. This trend is reflected in the growing emphasis on both renewable energy and energy efficiency measures to reduce the
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Date:
03/12/2013
Measuring and sourcing DC transients and other DC test conditions

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1. Biasing with a static DC voltage and measuring current: This is the most basic application of DC power related bench instruments. Any power supply, so long as it has the right voltage and current
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Date:
03/09/2013
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